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1

Determination of contact parameters of Ni/n-GaP Schottky contacts

S. Duman, K. Ejderha, Ö. Yiğit, A. Türüt

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 907 KB

english, 2012

2

Electrical and optical characteristics of Au/PbS/n-6H–SiC structures prepared by electrodeposition of PbS thin film on n-type 6H–SiC substrate

Y. Gülen, M. Alanyalıoğlu, K. Ejderha, Ç. Nuhoğlu, A. Turut

Journal:

Journal of Alloys and Compounds

Year:

2011

Language:

english

File:

PDF, 320 KB

english, 2011

3

The Effect of Thermal Annealing and Measurement Temperature on Interface State Density Distribution and Time Constant in Ni/n-GaP Rectifying Contacts

Ejderha, K., Orak, I., Duman, S., Turut, A.

Journal:

Journal of Electronic Materials

Year:

2018

Language:

english

File:

PDF, 2.86 MB

english, 2018

4

AIP Conference Proceedings [AIP INTERNATIONAL CONGRESS ON ADVANCES IN APPLIED PHYSICS AND MATERIALS SCIENCE - Antalya, (Turkey) (12–15 May 2011)] - Some Considerable Effects on Pt∕n-InP Schottky Diode Current-Voltage Characteristics due to Electron Irradiation

Korkut, H., Ejderha, K., Akbay, A., Öztürka, Y., Korkut, T., Türüt, A., Aslan, Muhammed Hasan, Oral, Ahmet Yayuz, Özer, Mehmet, Çaglar, Süleyman Hikmet

Year:

2011

Language:

english

File:

PDF, 348 KB

english, 2011

5

The effect of annealing temperature on the electrical characterization of Co/n type GaP Schottky diode

Orak, İ., Ejderha, K., Sönmez, E., Alanyalıoğlu, M., Turut, A.

Journal:

Materials Research Bulletin

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

6

Characteristic diode parameters in thermally annealed Ni/p-InP contacts

Turut, A., Ejderha, K., Yildirim, N., Abay, B.

Journal:

Journal of Semiconductors

Year:

2016

Language:

english

File:

PDF, 811 KB

english, 2016

7

Schottky barrier height modification in Au/n-type 6H–SiC structures by PbS interfacial layer

Y. Gülen, K. Ejderha, Ç. Nuhoğlu, A. Turut

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 337 KB

english, 2011

8

Temperature dependence of interface state density distribution determined from conductanceâfrequency measurements in Ni/n-GaP/Al diode

Duman, S., Ejderha, K., Orak, I., YÄ±ldÄ±rÄ±m, N., Turut, A.

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2020

File:

PDF, 2.48 MB

2020

9

Effect of different sound atmospheres on SnO 2 :Sb thin films prepared by dip coating technique

Kocyigit, Adem, Ozturk, Erhan, Ejderha, Kadir, Turgut, Guven

Journal:

Modern Physics Letters B

Year:

2017

Language:

english

File:

PDF, 2.93 MB

english, 2017

10

Temperature-dependent I-V characteristics in thermally annealed Co/p-InP contacts

Ejderha, K., Yıldırım, N., Türüt, A., Abay, B.

Journal:

The European Physical Journal Applied Physics

Year:

2012

Language:

english

File:

PDF, 402 KB

english, 2012

11

Temperature-dependent current-voltage characteristics in thermally annealed ferromagnetic Co/n-GaN Schottky contacts

Ejderha, Kadir, Yıldırm, N., Turut, A.

Journal:

The European Physical Journal Applied Physics

Year:

2014

Language:

english

File:

PDF, 499 KB

english, 2014

12

Responses of Pt/n-InP Schottky diode to electron irradiation in different temperature conditions

Atakan Akbay, Hatun Korkut, Kadir Ejderha, Turgay Korkut, Abdülmecit Türüt

Journal:

Journal of Radioanalytical and Nuclear Chemistry

Year:

2011

Language:

english

File:

PDF, 260 KB

english, 2011

13

Capacitance–conductance–current–voltage characteristics of atomic layer deposited Au/Ti/Al2O3/n-GaAs MIS structures

Turut, A., Karabulut, A., Ejderha, K., Bıyıklı, N.

Journal:

Materials Science in Semiconductor Processing

Year:

2015

Language:

english

File:

PDF, 908 KB

english, 2015

14

Capacitance–conductance characteristics of Au/Ti/Al 2 O 3 / n -GaAs structures with very thin Al 2 O 3 interfacial layer

Turut, A, Karabulut, A, Ejderha, K, Bıyıklı, N

Journal:

Materials Research Express

Year:

2015

Language:

english

File:

PDF, 1.00 MB

english, 2015

15

Effect of temperature on the current (capacitance and conductance)–voltage characteristics of Ti/n-GaAs diode

Ejderha, K., Duman, S., Nuhoglu, C., Urhan, F., Turut, A.

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 1.41 MB

english, 2014

16

Examination by interfacial layer and inhomogeneous barrier height model of temperature-dependent I–V characteristics in Co/p-InP contacts

K. Ejderha, N. Yıldırım, B. Abay, A. Turut

Journal:

Journal of Alloys and Compounds

Year:

2009

Language:

english

File:

PDF, 730 KB

english, 2009

17

Dependence of characteristic diode parameters on sample temperature in Ni/epitaxy n-Si contacts

K. Ejderha, A. Zengin, İ. Orak, B. Tasyurek, T. Kilinç, A. Turut

Journal:

Materials Science in Semiconductor Processing

Year:

2011

Language:

english

File:

PDF, 423 KB

english, 2011

18

Influence of interface states on the temperature dependence and current–voltage characteristics of Ni/p-InP Schottky diodes

K. Ejderha, N. Yıldırım, A. Türüt, B. Abay

Journal:

Superlattices and Microstructures

Year:

2010

Language:

english

File:

PDF, 1.85 MB

english, 2010

19

Temperature dependence of electrical parameters of the Cu/n-Si metal semiconductor Schottky structures

BakkaloÄlu, Ãmer Faruk, Ejderha, Kadir, EfeoÄlu, Hasan, KarataÅ, ÅÃ¼krÃ¼, TÃ¼rÃ¼t, AbdÃ¼lmecit

Journal:

Journal of Molecular Structure

Year:

2020

File:

PDF, 1.62 MB

2020

20

The electrical characterizations and illumination response of Co/N-type GaP junction device

Orak, İkram, Ejderha, Kadir, Turut, Abdulmecit

Journal:

Current Applied Physics

Year:

2015

Language:

english

File:

PDF, 1.55 MB

english, 2015

21

The Characteristic Parameters of Ni/n-6H-SiC Devices Over a Wide Measurement Temperature Range

Ejderha, Kadir, Karabulut, Abdulkerim, Turkan, Nurettin, Turut, Abdulmecit

Journal:

Year:

2017

Language:

english

File:

PDF, 472 KB

english, 2017

22

THE CHARACTERISTIC DIODE PARAMETERS IN Ti/p-InP CONTACTS PREPARED BY DC SPUTTERING AND EVAPORATION PROCESSES OVER A WIDE MEASUREMENT TEMPERATURE

EJDERHA, KADIR, ASUBAY, SEZAI, YILDIRIM, NEZIR, GÜLLÜ, ÖMER, TURUT, ABDULMECIT, ABAY, BAHATTIN

Journal:

Surface Review and Letters

Year:

2016

Language:

english

File:

PDF, 380 KB

english, 2016

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